Creating Thermally Stable Probing Environments
Accurate and reliable probing is essential to the development and manufacturing of semiconductor devices. Challenges presented from the complex nature of probing itself are compounded by the necessity to test chips under a wide variety of environmental conditions.
Syensqo supplies the semiconductor industry with a portfolio of high-quality solutions to create more durable and thermally stable probing materials. Our innovative technologies provide OEMs with unique performance and durability benefits for their probing systems.
Materials for Excellent Prober Performance
Syensqo offers a range of solutions so that chip manufacturers can match their probing system for the specific testing needs of each wafer type. Galden® PFPE and Torlon® PAI are known industry-wide for their exceptional performance under the most demanding of conditions.
Improving Semiconductor Probe Performance
Syensqo is the industry’s most trusted partner to supply reliable materials for semiconductor manufacturing. Our industry-proven technologies aid prober OEMs by improving manufacturability while optimizing end-use performance. Manufacturers trust Syensqo's expertise when designing probe cards and temperature control units for their wafer probing systems.
Probe Cards
Probe cards are one of the major components of a wafer prober. They ensure that the probes contact the wafer in a controlled and reliable manner at each test point. Torlon® PAI thermoplastics are an ideal fit for the probes because of their outstanding dimensional stability in severe service conditions of up to 260°C.
Heat Transfer
Tight control over the testing temperature is critical to an efficient and effective probing system. Galden® PFPE is available in a variety of boiling points to accommodate the most demanding probing environments while providing the chemical stability that has made Galden an industry leader. Newly developed Z-Galden® PFPE, which has a wider operable temperature range than Galden, can help to minimize complexity in tests covering a wide range of conditions.
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